The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Feb. 04, 2004
Yoshinori Iketaki, Oume, JP;
Takeshi Watanabe, Yamato, JP;
Masaaki Fujii, Yokohama, JP;
Yasunori Igasaki, Hamamatsu, JP;
Toshio Suzuki, Chiba, JP;
Yoshinori Iketaki, Oume, JP;
Takeshi Watanabe, Yamato, JP;
Masaaki Fujii, Yokohama, JP;
Yasunori Igasaki, Hamamatsu, JP;
Toshio Suzuki, Chiba, JP;
Japan Science and Technology Agency, Kawaguchi, JP;
Olympus Corporation, Tokyo, JP;
Hamamatsu Photonics KK, Hamamatsu, JP;
Nippon Roper KK, Chiba, JP;
Abstract
A microscope capable of being shaped into a beam with complete hollow shape by removing the disorder of the wavefront to the erase light, particularly, and capable of improving the spatial resolution by inducing a super-resolution near the limit, is provided. In the microscope, wherein a first light to excite a molecule from a ground-state to first electron excited state or a second light to excite the molecule from the first electron excited state to the second electron excited state with higher energy level, for a sampleincluding the molecule with three electronic states including at least a ground-state, are spatial phase-modulated into the prescribed beam shape, and parts of these first light and the second light are overlapped and focused to detect luminescence from the sample, a wavefront compensation meansis provided in the optical path of the first light and/or in the optical path of the second light, and the wavefront aberration caused in the first light and/or in the second light, is removed by the wavefront compensation means