The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Dec. 02, 2003
Kenji Fukui, Sagamihara, JP;
Kenji Fukui, Sagamihara, JP;
Pulstec Industrial Co., Ltd., Hamamatsu, JP;
Abstract
The interferometer has a diffraction grating, a condenser lens, a transparent substrate, a field lensand an imaging devicearranged in this order. The transparent substrateis arranged at the position in the optical axis direction where both focal spots of a zeroth-order diffracted light Land a first-order diffracted light Lare formed. Formed on the transparent substrateis a circular opaque zonewhose central position is the central position of the focal spot of the first-order diffracted light L. Formed at the center of the opaque zoneis a pinholewhose central position is the central position of the focal spot of the first-order diffracted light L. The contrast of the interference fringes observed on the image deviceis enhanced by the optical interference between the first-order diffracted light Lpassing through the pinholeand the zeroth-order diffracted light Lpassing through the transparent substrate