The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

Mar. 22, 2005
Applicants:

Vinson Chan, Fremont, CA (US);

Chong Lee, San Ramon, CA (US);

Huy Ngo, Redwood City, CA (US);

Inventors:

Vinson Chan, Fremont, CA (US);

Chong Lee, San Ramon, CA (US);

Huy Ngo, Redwood City, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Circuitry for detecting excessive runs of similar bits of data in a data stream is provided. The data stream is typically received as serial data operating in a serial clock domain. Run-length detection circuitry checks the received data for run-length violations while operating in a slower parallel clock domain, as opposed to the faster serial clock domain. An advantage of operating run-length detection circuitry in the parallel domain is that longer length run-length violations can be searched for in the received data, as compared to run-length detectors that operate in the serial domain. Another advantage offered by the circuitry is that the run-length violation signal can be provided to utilization circuitry asynchronously. This enables utilization circuitry to quickly capture the signal despite differences in clock domains (i.e., the clock domain of the detection circuitry and the clock domain of the utilization circuitry).


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