The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Sep. 30, 2003
Patrick C. Herbert, Mentor, OH (US);
Richard D. Harris, Mentor, OH (US);
Frederick M. Discenzo, Brecksville, OH (US);
Michael J. Knieser, Fortville, IN (US);
Robert J. Kretschmann, Bay Village, OH (US);
Mark A. Lucak, Hudson, OH (US);
Robert J. Pond, Doylestown, OH (US);
Louis F. Szabo, Broadview Heights, OH (US);
Patrick C. Herbert, Mentor, OH (US);
Richard D. Harris, Mentor, OH (US);
Frederick M. Discenzo, Brecksville, OH (US);
Michael J. Knieser, Fortville, IN (US);
Robert J. Kretschmann, Bay Village, OH (US);
Mark A. Lucak, Hudson, OH (US);
Robert J. Pond, Doylestown, OH (US);
Louis F. Szabo, Broadview Heights, OH (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
A microelectromechanical system (MEMS) strain gauge includes at least one flexible arm that can be caused to oscillate. Transverse strain on the arm changes the resonant frequency of the arm. A detector communicating with the flexible arm may detect the frequency of oscillation to provide, an indication of the transverse strain of the substrate.