The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Feb. 04, 2005
Naoyuki Kono, Mito, JP;
Tetsuya Matsui, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Masahiro Tooma, Kanasago, JP;
Yoshinori Musha, Hitachiota, JP;
Masahiro Miki, Tokai, JP;
Naoyuki Kono, Mito, JP;
Tetsuya Matsui, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Masahiro Tooma, Kanasago, JP;
Yoshinori Musha, Hitachiota, JP;
Masahiro Miki, Tokai, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to make it possible in ultrasonic flaw detection to generate ultrasonic waves containing a main beam only by use of an array probe and clearly identify a defect in a specimen by use of images, an element pitch P (the distance between centers of adjacent ultrasonic transducer elements in the array probe) is set longer than ¼ of the wavelength of longitudinal waves generated by the ultrasonic transducer elements and shorter than ½ of the wavelength and reception signals up to time corresponding to the sum of wall thickness round-trip propagation time for longitudinal waves and wall thickness round-trip propagation time for shear waves in the specimen are displayed.