The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Dec. 13, 2002
Herrick J. Andrews, Redmond, WA (US);
Maxim V. Stepin, Bothell, WA (US);
Herrick J. Andrews, Redmond, WA (US);
Maxim V. Stepin, Bothell, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A novel system and method provides a concrete relative measure for evaluating coding quality. The novel system and method do not rely on bug counting. Instead, the number of defective lines of code is compared to a total number of opportunities to create such defects. A defective line is a line that is deleted, added or changed subsequent to drafting of the prior version of the code. In an embodiment, a deletion and an addition are each treated as single defects, while modification of a line of code is treated as two defects. In this way, regardless of whether modification is viewed as deletion followed by addition, or rather simply a single step of modification, the number of defects in either case is the same.