The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2006

Filed:

May. 10, 2004
Applicants:

Patrick M. Williams, Poughkeepsie, NY (US);

EE K. Cho, Poughkeepsie, NY (US);

David J. Hathaway, Underhill, VT (US);

Mei-ting Hsu, Poughquag, NY (US);

Lawrence K. Lange, Wappingers Falls, NY (US);

Gregory A. Northrop, Putnam Valley, NY (US);

Chandramouli Visweswariah, Croton-on-Hudson, NY (US);

Cindy Shuiking Washburn, Poughquag, NY (US);

Jun Zhou, Poughkeepsie, NY (US);

Inventors:

Patrick M. Williams, Poughkeepsie, NY (US);

Ee K. Cho, Poughkeepsie, NY (US);

David J. Hathaway, Underhill, VT (US);

Mei-Ting Hsu, Poughquag, NY (US);

Lawrence K. Lange, Wappingers Falls, NY (US);

Gregory A. Northrop, Putnam Valley, NY (US);

Chandramouli Visweswariah, Croton-on-Hudson, NY (US);

Cindy ShuiKing Washburn, Poughquag, NY (US);

Jun Zhou, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A Digital Design Method which may be automated is for obtaining timing closure in the design of large, complex, high-performance digital integrated circuits. The methodincludes the use of a tuner on random logic macros that adjusts transistor sizes in a continuous domain. To accommodate this tuning, logic gates are mapped to parameterized cells for the tuning and then back to fixed gates after the tuning. Tuning is constrained in such a way as to minimize 'binning errors' when the design is mapped back to fixed cells. Further, the critical sections of the circuit are marked in order to make the optimization more effective and to fit within the problem-size constraints of the tuner. A specially formulated objective function is employed during the tuning to promote faster global timing convergence, despite possibly incorrect initial timing budgets. The specially formulated objective function targets all paths that are failing timing, with appropriate weighting, rather than just targeting the most critical path. Finally, the addition of multiple threshold voltage gates allows for increased performance while limiting leakage power.


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