The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7092843 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 15, 2006

Filed:

Oct. 21, 2004
Applicants:

Michael D. Moore, Alplaus, NY (US);

John H. Burdett, Jr., Charlton, NY (US);

Ian Radley, Glenmont, NY (US);

Stuart M. Shakshober, Hudson, NY (US);

Inventors:

Michael D. Moore, Alplaus, NY (US);

John H. Burdett, Jr., Charlton, NY (US);

Ian Radley, Glenmont, NY (US);

Stuart M. Shakshober, Hudson, NY (US);

Assignee:

X-Ray Optical Systems, Inc., East Greenbush, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 17/18 (2006.01); G06F 19/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement and processing technique enabling x-ray analysis systems to handle dynamically changing samples and other conditions resulting in both significant and insignificant measurement changes. A stream of input values related to measured compositional information of the sample is received, and a stream of output compositional values is produced. The current output value y[n] is set as a function of the received input value x[n] if the received input value x[n] differs from x[n−1] by more than an intensity-dependent deviation limit; and alternatively the current output y[n] is set as a function of the previous output y[n−1] and the received input value x[n] if the received input value x[n] differs from x[n−1] by less than the intensity-dependent deviation limit. The intensity-dependent deviation limit is maintained as a function of the intensity of the measured compositional information. Types of dynamically changing samples to which the technique is applicable include fluid streams and sheet production, monitored by, e.g., XRF and XRD systems.


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