The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Oct. 28, 2005
Walter Caswell Reade, Appleton, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Paul D. Fuller, Menasha, WI (US);
Melissa S. Klaips, Greenville, WI (US);
Charles Earl Markham, Appleton, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Paul D. Fuller, Menasha, WI (US);
Melissa S. Klaips, Greenville, WI (US);
Charles Earl Markham, Appleton, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
A data integrity module and method for evaluating data in a process information database. A neural network generates statistical patterns for specifying patterns for the data being evaluated. A fuzzy expert rules base specifies rules for evaluating the data. A processor, responsive to the rules base and the statistical patterns, identifies suspect data in the process information database by evaluating the data according to the rules base and the statistical patterns. A modification system modifies the suspect data in the process information database.