The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Dec. 29, 2003
Qicai Shi, Coral Springs, FL (US);
Neiyer S. Correal, Cooper City, FL (US);
Paul E. Gorday, West Palm Beach, FL (US);
Spyros Kyperountas, Coral Springs, FL (US);
Feng Niu, Weston, FL (US);
Qicai Shi, Coral Springs, FL (US);
Neiyer S. Correal, Cooper City, FL (US);
Paul E. Gorday, West Palm Beach, FL (US);
Spyros Kyperountas, Coral Springs, FL (US);
Feng Niu, Weston, FL (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A method and system is provided for determining a location for each of a plurality of units, which is selected from one of multiple sets of locations, which are each estimated based upon different initial location estimates. The selected set of locations includes the set which has the minimum error value, where the error value is based on the aggregate of the differences between the range determined from the estimated locations and the measured range. By using different sets of initial location estimates, there is a greater chance that at least one of the sets of initial location estimates will avoid any local minimums and produce a more accurate estimate of unit locations.