The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Apr. 26, 2001
Marc Viala, Guyancourt, FR;
Sylvie Naudet, Palaiseau, FR;
Patrick Sayd, Palaiseau, FR;
Laurent Cohen, Paris, FR;
Arnauld Dumont, Le Mesnil-Saint-Denis, FR;
Frédéric Jallon, Poigny la Foret, FR;
Marc Viala, Guyancourt, FR;
Sylvie Naudet, Palaiseau, FR;
Patrick Sayd, Palaiseau, FR;
Laurent Cohen, Paris, FR;
Arnauld Dumont, Le Mesnil-Saint-Denis, FR;
Frédéric Jallon, Poigny la Foret, FR;
Commissariat a l'Energie Atomique, Paris, FR;
Compagnie Generale des Matieres Nucleaires, Velizy-Villacoublay, FR;
Abstract
In this system, three-dimensional objects () in an environment that may be very complex are discerned by identifying their simple contour shapes on images, and the geometric characteristics of these objects and their positions and orientations are then measured. Contours are defined by simple length, inclination, position parameters, etc. The acquired knowledge of the environment is used in each new image to refine the estimates, while introducing new object contours that have appeared, into the model.