The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2006

Filed:

Feb. 28, 2002
Applicant:

Eiji Saruwatari, Hino, JP;

Inventor:

Eiji Saruwatari, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a line quality monitoring method of detecting a code error rate by identifying a received optical signal using different identification levels and executing bit comparison after identification, an amplitude of the signal and noise power contained in the signal are detected, and a difference between the different identification levels is controlled to be inversely proportional to the amplitude of the signal and to be proportional to the noise power of the signal. Alternatively, the amplitude of the signal is controlled to be constant and the difference between the different identification levels is controlled to be proportional to the noise power of the signal.


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