The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Mar. 13, 2002
Young DO Choi, Kyunggi-do, KR;
Keuk Young Bang, Kyunggi-do, KR;
Cheol Jin, Kyunggi-do, KR;
Hitachi-LG Data Storage Korea, Inc., Seoul, KR;
Abstract
The present invention relates to a method of detecting a defect area without any mistake during data recording on a writable disk. This method detects a level of a servo error signal produced during a recording operation, checks whether the servo error signal is in an abnormal state based on the detected level, detects a periodic wobble signal or periodicity of the abnormal state occurrences of the servo error signal produced during the recording operation, and determines whether a recording area is in defect based on successful decoding of the detected periodic wobble signal or the periodicity of the abnormal state occurrences if the servo error signal is in an abnormal state. This method ensures exact detection of a defect area, whereby unnecessary speed reduction can be eliminated and successful data writing can be also guaranteed even in a defect area.