The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Feb. 23, 2004
Jianmin Wang, Fremont, CA (US);
Jason L. Pressesky, Menlo Park, CA (US);
Jianmin Wang, Fremont, CA (US);
Jason L. Pressesky, Menlo Park, CA (US);
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
An arrangement and method for reliably finding the wave form extrema of interference signals produced by a quadrature phase shift interferometer (QPSI) takes advantage of the quadrature property of I and Q signals. The zero-crossing points in the I and Q signals are determined. Peak detection is performed for peaks and valleys in the Q signal in close proximity to the zero-crossing points in the I signal, and for peaks and valleys in the I signal in close proximity to the zero-crossing points in the Q signal. These represent the maximum and minimum points of the I and Q signals. From these points, intensity envelopes are created and QPSI phase wrapping is performed to determine the phase angle and ultimately, out-of-plane displacement may be determined.