The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2006

Filed:

Sep. 16, 2003
Applicants:

Akshaya Kumar, Starkville, MS (US);

Fang Yu-yueh, Starkville, MS (US);

Shane C. Burgess, Starkville, MS (US);

Jagdish P. Singh, Starkville, MS (US);

Inventors:

Akshaya Kumar, Starkville, MS (US);

Fang Yu-Yueh, Starkville, MS (US);

Shane C. Burgess, Starkville, MS (US);

Jagdish P. Singh, Starkville, MS (US);

Assignee:

Mississippi State University, Mississippi State, MS (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to an apparatus, a system and a method for detecting the presence or absence of trace elements in a biological sample using Laser-Induced Breakdown Spectroscopy. The trace elements are used to develop a signature profile which is analyzed directly or compared with the known profile of a standard. In one aspect of the invention, the apparatus, system and method are used to detect malignant cancer cells in vivo.


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