The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7092081 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 15, 2006

Filed:

Dec. 30, 2003
Applicants:

Yen-lin Wang, Miaoli Hsien, TW;

Ju-chung Chen, Taipei Hsien, TW;

Shu-shin Lin, Yunlin Hsien, TW;

Inventors:

Yen-Lin Wang, Miaoli Hsien, TW;

Ju-Chung Chen, Taipei Hsien, TW;

Shu-Shin Lin, Yunlin Hsien, TW;

Assignee:

RiTdisplay Corporation, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring the optoelectric properties of an organic light-emitting device (OLED) comprising a platform, a goniometer, a three-axis moving device and a computer. The goniometer is disposed on one side of the platform and an OLED is disposed on the goniometer. The three-axis moving device is disposed on another side of the platform. The photo-detector is disposed on the three-axis moving device with the photo-detector toward the OLED on the goniometer. The goniometer, the three-axis moving device and the photo-detector are connected to the computer.


Find Patent Forward Citations

Wang, Yen-Lin. (2006). Apparatus for measuring optoelectric properties of oled and the measurement method thereof (U.S. Patent No. 7092081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7092081

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