The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Nov. 19, 2003
Applicant:
Hiroshi Sakai, Nagano, JP;
Inventor:
Hiroshi Sakai, Nagano, JP;
Assignee:
NIDEC Sankyo Corporation, Nagano, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A light intensity distribution measuring method for measuring the light intensity distribution of a laser beam emitted by a semiconductor laser comprises the steps of measuring light intensities at a plurality of locations in a laser beam emitted by a semiconductor laser and applying their measurement results to a t distribution function to calculate the light intensity distribution. A light intensity distribution measuring device is also described.
Sakai, Hiroshi. (2006). Light intensity distribution measuring method and light intensity distribution measuring device (U.S. Patent No. 7092080). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7092080
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