The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Nov. 28, 2002
Applicants:
Michael Ganser, Giessen, DE;
Joachim Wesner, Lahnau, DE;
Inventors:
Michael Ganser, Giessen, DE;
Joachim Wesner, Lahnau, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object () between the objective () of the microscope () and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.