The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Jul. 29, 2004
Dalju Nakano, Sagamihara, JP;
Yoshitami Sakaguchi, Hadano, JP;
Dalju Nakano, Sagamihara, JP;
Yoshitami Sakaguchi, Hadano, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An inspection system for inspecting characteristics of an active matrix panel before formation of OLEDs includes: a roller contact probe having a conductive material on at least a surface thereof and sequentially contacting pixel electrodes formed on the active matrix panel while rotating; probe control circuits having capability to apply a voltage necessary for measurement to TFT arrays including pixel electrodes with which the roller contact probe is in contact; and a computer measuring currents flowing through the TFT arrays to which a voltage is applied and statistically processing the measurement results.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile