The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2006

Filed:

Sep. 30, 2004
Applicants:

Chung-shan Lee, Taoyuan City, TW;

Hsu-lin Ting, Changhua County, TW;

Inventors:

Chung-Shan Lee, Taoyuan City, TW;

Hsu-Lin Ting, Changhua County, TW;

Assignee:

Asustek Computer Inc., Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/67 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing probe includes a first sleeve, a first springy component, a first movable rod, a second springy component, and at least one second movable rod. The first sleeve has a first containing portion, which is located inside the first containing portion. The first movable rod is partially inserted into the first containing portion, and has a first stopper portion and a second containing portion. The first stopper portion is located inside the first containing portion and contacts the first springy component, so that the first movable rod and first containing portion are capable of relatively sliding. The second springy component is located inside the second containing portion. The second movable rod is partially inserted into the second containing portion, and has a second stopper portion. The second stopper portion is located inside the second containing portion and contacts the second springy component, so that the second movable rod and second containing portion are capable of relatively sliding.


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