The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Jul. 15, 2005
Mahesh P. Parshotam, Edmonds, WA (US);
James M. Graverholt, Stanwood, WA (US);
Alan D. Howard, Everett, WA (US);
Mahesh P. Parshotam, Edmonds, WA (US);
James M. Graverholt, Stanwood, WA (US);
Alan D. Howard, Everett, WA (US);
Huntron, Inc., Mill Creek, WA (US);
Abstract
The dual probe assembly is used with a printed circuit board test apparatus. It includes a first, satellite test probe holder for a first, satellite test probe and a motor for rotating the first test probe holder. It further includes a second, main test probe holder for a second, main test probe and a motor for moving the second test probe holder. The first test probe holder can move without affecting the position of the second test probe, while the second test probe holder is connected to the first test probe holder in such a manner that movement of the second test probe holder moves the first test probe holder, wherein both a selected distance between the two test probes and a selected angular orientation therebetween can be achieved.