The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
Mar. 26, 2004
Pavel Horsky, Brno, CZ;
Ivan Koudar, Slapanice U Brna, CZ;
Pavel Horsky, Brno, CZ;
Ivan Koudar, Slapanice U Brna, CZ;
AMI Semiconductor Belgium BVBA, Oudenaarde, BE;
Abstract
A measurement method or system for measuring a physical value comprises, during a same clock cycle, forming an input signal, a reference signal and an offset signal, the input signal including a parasitic value and a useful measurement value. A relationship between the input signal where the parasitic value has been cancelled out, and the reference signal is derived. From this relationship, a value relating to the physical value is determined. The input signal, reference signal and offset signal are respectively associated with an input element, a reference element and a parasitic element. All elements have a common driving signal, and the parasitic value is depending on the common driving signal. The fact that different signals are formed during a same measurement cycle, and that these signals are sufficient to obtain the desired physical value, makes the measurement method or system of the present invention faster than prior art measurement methods or systems: only one conversion cycle is needed against two cycles needed for dual slope analog-to-digital conversion.