The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2006
Filed:
May. 14, 2004
Applicants:
Jeffrey A. Kautzer, Pewaukee, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
Olgun Kukrer, Waukesha, WI (US);
Inventors:
Jeffrey A. Kautzer, Pewaukee, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
Olgun Kukrer, Waukesha, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); H01L 27/00 (2006.01); H01L 27/146 (2006.01); G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a system and method by which the magnitude of an interfering electrical and/or magnetic field may be sampled locally (in the X-ray detector for example) and reduced or eliminated. More specifically, embodiments comprise a system and method by which an interfering field may be sampled within the same orientation as the X-ray detector panel, and then subtracted out of each respective element sample.