The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2006

Filed:

Dec. 14, 2001
Applicant:

Jorma Virtanen, Irvine, CA (US);

Inventor:

Jorma Virtanen, Irvine, CA (US);

Assignees:

Burstein Technologies, Inc., Los Angeles, CA (US);

Nagaoka & Co., Ltd., Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection system for use in optical disk-based devices for measuring the presence of an analyte in a sample. The detection system includes an analyte detector unit containing a primary detector which selectively reacts with analyte present in a sample to produce an amplification agent. The detection system further includes an amplification unit comprising a plurality of secondary detection agents which are each changeable between a negative and positive detection state. A fluid connection is provided between the analyte detector unit and amplification unit to provide reactive contact between the amplification agent and the plurality of detection agents. The amplification agent is capable of changing a plurality of detection agents between the negative and positive detection states to thereby amplify the measurable presence of the analyte.


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