The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2006

Filed:

May. 31, 2001
Applicants:

Katsuhiko Ueki, Tokyo, JP;

Humitaka Tamura, Kawasaki, JP;

Wataru Okamoto, Yokohama, JP;

Inventors:

Katsuhiko Ueki, Tokyo, JP;

Humitaka Tamura, Kawasaki, JP;

Wataru Okamoto, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A log in which a series of events occurred as a result of the execution of the target program has been recorded is inputted. A plurality of partial logs are created from the inputted log. These partial logs are normalized on the basis of the master log serving as a normalization reference. The feature value representing the degree of feature of the occurrence and nonoccurrence of an event is calculated for each of the normalized logs on the basis of the normalized logs for the remaining partial logs. In a combination of a specific partial log and another partial log, the similarity between these partial logs is calculated by performing an operation on the basis of the feature values. For example, a combination of the specific partial log and the partial log with the highest similarity is displayed.


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