The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2006

Filed:

Mar. 19, 2004
Applicants:

Karen A. Bard, Hopewell Junction, NY (US);

Ronald D. Rose, Essex Junction, VT (US);

Michael H. Sitko, Jericho, VT (US);

Inventors:

Karen A. Bard, Hopewell Junction, NY (US);

Ronald D. Rose, Essex Junction, VT (US);

Michael H. Sitko, Jericho, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, system and program product for designing an integrated circuit (IC) for signal integrity. The invention conducts a signal integrity analysis on an IC design; identifies any field effect transistor (FET) that causes a signal integrity failure in the case that the IC design fails the signal integrity analysis; and modifies an edge of a failing FET that is closer than a threshold distance to a well edge. The invention eliminates the manual, iterative procedure for determining the device causing a signal integrity failure due to well proximity effects.


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