The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Sep. 25, 2002
Arthur Leonard Rubin, Brea, CA (US);
Timothy Robert Schempp, Anaheim, CA (US);
Arthur Leonard Rubin, Brea, CA (US);
Timothy Robert Schempp, Anaheim, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
Mechanisms and techniques provide a system to evaluate operational integrity of a data processing system such as an area augmentation system by obtaining at least one set of distribution data related to information processed by the data processing system. The set(s) of distribution data can include corrections information and integrity bounds information related to the corrections information. The system applies a moment generating function to the set of distribution data to produce a moment bounded distribution data result and compares the moment bounded distribution data result to an integrity limit to determine if the data processing system operates within an acceptable integrity threshold. The system can be used in real-time or non-real time with sets of distribution data that are non-Gaussian, non-symmetric and/or non-unimodal.