The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Nov. 22, 2001
Koen Maertens, Ghent, BE;
Koen Maertens, Ghent, BE;
CNH America LLC, New Holland, PA (US);
Abstract
A method of estimating the instantaneous crop yield ŷ(t) at time t in a field, during harvesting with a harvesting machine that operates by cutting and/or controlling the crop and has a crop mass flow sensor that measures the mass flow rate of crop processed by the machine at a location remote from that at which the harvesting machine cuts the crop and generates a signal {dot over ({circumflex over (m)}(t) indicative thereof, including the steps of: generating a mass flow rate signal {dot over ({circumflex over (m)}(t) using the sensor;generating an area rate signal ŝ(t) indicative of time domain variations in the area of the field harvested per time unit;filtering the area rate signal ŝ(t) using a function P(s) representative of the dynamics of the harvesting machine to generate a filtered area rate signal ŝ(t); andusing the filtered area rate signal ŝ(t) for deriving from the mass flow rate signal {dot over ({circumflex over (m)}(t) a yield per area unit ŷ(t).