The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Jul. 06, 2005
Neil A. Reitmeyer, Shohola, PA (US);
Sean M. Dickinson, Colchester, VT (US);
Yutong Wu, Hopewell Junction, NY (US);
Neil A. Reitmeyer, Shohola, PA (US);
Sean M. Dickinson, Colchester, VT (US);
Yutong Wu, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Controlling stocker capacity in an automated facility and controlling monitor budgets by capped releases, capped FOUP supplies, and wafer reuse methodology. A Database is used to order, track, and reclaim test (monitor) wafers in the FAB. The database automatically controls the amount of FOUPs in the FAB as well as the amount of wafers released into the FAB each day. This database also interacts with the Control Center in helping to release monitor wafers in the FAB.