The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Mar. 13, 2003
Konstantin Anisimovich, Moscow, RU;
Vadim Tereshchenko, Moscow, RU;
Vladimir Rybkin, Moscow, RU;
Dmitry Vnuchkov, Moscow, RU;
Konstantin Anisimovich, Moscow, RU;
Vadim Tereshchenko, Moscow, RU;
Vladimir Rybkin, Moscow, RU;
Dmitry Vnuchkov, Moscow, RU;
ABBYY Software Ltd., Nicosia, CY;
Abstract
A method is described of bit-mapped image analysis comprising division of all analysis means at one's disposal into several groups differing in accuracy and further processing multi-stage analysis. The analysis comprises a primary analysis stage and at least one profound analysis stage, with supplemental data collected at both stages. The primary analysis, includes preliminary recognition of objects with distortion and detection of objects that require more precise analysis means to overcome the distortion. At the primary analysis stage, the analysis means from the group of the most inaccurate group are used. The profound analysis stage includes repeating recognition of objects with a distortion taking into account the supplemental data obtained at the previous stage, detecting objects that require more precise analysis means to overcome the distortion, and collection of newly appeared supplemental data. Each subsequent profound analysis stage uses analysis means from the group of more accurate means.