The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Dec. 06, 2000
Roger A. Green, Fargo, ND (US);
David C. Farden, Fargo, ND (US);
John W. Pierre, Laramie, WY (US);
Richard C. Anderson-sprecher, Laramie, WY (US);
Edwin A. Suominen, Phoenix, AZ (US);
Roger A. Green, Fargo, ND (US);
David C. Farden, Fargo, ND (US);
John W. Pierre, Laramie, WY (US);
Richard C. Anderson-Sprecher, Laramie, WY (US);
Edwin A. Suominen, Phoenix, AZ (US);
NDSU Research Foundation, Fargo, ND (US);
University of Wyoming, Laramie, WY (US);
Abstract
An exemplary signal processing system determines vector mismatch between a plurality of signal paths. Advantageously, the system can determine mismatch across a range of frequencies. A signal generator of the system can provide a periodic calibration signal having a plurality of frequency components. The system frequency can translate the calibration signal to provide a first set of observed samples. The first sample set can be compared to a second set of samples, which can be modeled by a function of parameters including an estimated vector mismatch and a plurality of basis functions. A value of vector mismatch can then be determined (at least to an estimate) that minimizes the difference between the first sample set and the second sample set. Methods and other systems with different advantageous configurations are also described.