The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Jun. 14, 2002
Sean J. Kirkpatrick, Portland, OR (US);
Donald D. Duncan, Silver Spring, MD (US);
Sean J. Kirkpatrick, Portland, OR (US);
Donald D. Duncan, Silver Spring, MD (US);
Providence Health Systems —Oregon, Portland, OR (US);
Abstract
Methods for measuring strains in biological and other samples include illuminating a specimen with substantially collimated laser flux. An electro-acoustic transducer is activated to generate acoustic waves in the specimen, including a surface wave component such as a Rayleigh wave. A series of laser speckle patterns produced by a laser flux scattered or reflected by the specimen is recorded and speckle pattern shifts are calculated based on the recorded speckle patterns. Phase shifts produced by acoustic wave propagation in the specimen are used to identify specimen regions associated with irregularities such as inclusions, cracks, or tissue abnormalities. In some examples, specimens are stretched or otherwise stressed by one or more light fluxes, and specimen elongation is estimated based on a series of associated speckle patterns.