The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Sep. 01, 2005
Yasufumi Fukuma, Itabashi-ku, Tokyo, JP;
Takeyuki Kato, Itabashi-ku, Tokyo, JP;
Eiichi Yanagi, Itabashi-ku, Tokyo, JP;
Yasufumi Fukuma, Itabashi-ku, Tokyo, JP;
Takeyuki Kato, Itabashi-ku, Tokyo, JP;
Eiichi Yanagi, Itabashi-ku, Tokyo, JP;
Other;
Abstract
A lens meter having a measurement optical system including a light-emitting optical system, emitting a measurement luminous flux to an eyeglass lens, and a light-receiving optical system having a light-receiving element, receiving the measurement luminous flux passing through the eyeglass lens, an eyeglass holding device between the light-emitting and light-receiving systems, and an arithmetic control circuit computing characteristics of the lens based on receiving element output. The holding device includes a lens receiver supporting the lens, and an eyeglass sandwiching unit, which sandwiches the eyeglasses. The lens receiver is freely movable between the measurement optical path of the measurement optical system and a withdrawal position outside the path, and is moved in the withdrawal position after the eyeglasses have been sandwiched by the sandwiching unit.