The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Aug. 19, 2004
Applicants:
Udo Hartmann, Neuried, DE;
Thierry Canaud, München, DE;
Inventors:
Udo Hartmann, Neuried, DE;
Thierry Canaud, München, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a test arrangement for testing semiconductor circuit chips, in which a test signal received via a primary test channel from a driver amplifier of an item of test equipment is distributed via parallel sub-channels to a plurality of inputs of one or more semiconductor circuit chips under test the test arrangement having signal buffering circuits arranged in each sub-channel that receive and buffer the test signal from the driver amplifier before feeding it to the inputs of the semiconductor circuit chip(s).