The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Jan. 19, 2005
Applicants:
Michael S. Marzalek, Santa Rosa, CA (US);
David J. Ballo, Santa Rosa, CA (US);
Inventors:
Michael S. Marzalek, Santa Rosa, CA (US);
David J. Ballo, Santa Rosa, CA (US);
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of measuring a device under test ('DUT') includes applying a pulsed-RF input signal to the DUT and coupling an output of the DUT to a receiver having an output bandwidth selected to measure a center tone in an RF pulse response spectrum from the output of the DUT. The receiver is triggered so as to sample data output from the DUT during a window period, and stops taking data after the window period.