The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Jan. 22, 2004
Applicants:
Werner Knebel, Kronau, DE;
Rafael Storz, Heidelberg, DE;
Kyra Moellmann, Trippstadt, DE;
Inventors:
Assignee:
Leica Mircosystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); H01J 5/16 (2006.01); H01J 40/14 (2006.01); G02F 1/33 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning microscope having an acoustooptical component that splits out illuminating light for illumination of a sample from the output light of at least one light source, and conveys detected light proceeding from the sample to a detector, comprises, in the beam path of the output light from which the illuminating light is split out, at least one monitoring detector which is the measuring element of a control circuit. The scanning microscope is characterized in that fluctuations over time in the illuminating light power level are largely eliminated.