The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Nov. 06, 2003
Dorin Comaniciu, Princeton, NJ (US);
Arun Krishnan, Exton, PA (US);
Xiang Sean Zhou, Plainsboro, NJ (US);
Bhavani Duggirala, Bellevue, WA (US);
Diane Paine, Redmond, WA (US);
Dorin Comaniciu, Princeton, NJ (US);
Arun Krishnan, Exton, PA (US);
Xiang Sean Zhou, Plainsboro, NJ (US);
Bhavani Duggirala, Bellevue, WA (US);
Diane Paine, Redmond, WA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A system and method for assigning feature sensitivity values to a set of potential measurements to be taken during a medical procedure of a patient in order to provide a medical diagnosis is disclosed. Data is received from a sensor that represents a particular medical measurement. The received data and context data are analyzed with respect to one or more sets of training models. Feature sensitivity values are derived for the particular medical measurement and other potential measurements to be taken based the analysis, and the feature sensitivity values are outputted.