The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7086936 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 08, 2006

Filed:

Dec. 22, 2003
Applicant:

Adrian Kiermasz, Union City, CA (US);

Inventor:

Adrian Kiermasz, Union City, CA (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A linear chemical mechanical planarization (CMP) belt pad includes a first portion comprised of a first pad material, e.g., polyurethane, and a second portion comprised of a second pad material, e.g., porous rubber. The first portion has a first end and a second end. The second portion is situated between the first and second ends of the first portion and extends substantially across a width of the belt pad. Alternatively, the second portion may be embedded in the first portion such that a peripheral surface of the second portion is surrounded by a surface of the first portion. A linear CMP system and a method for planarizing a wafer in a single linear CMP module also are described.


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Kiermasz, Adrian. (2006). Linear chemical mechanical planarization (cmp) system and method for planarizing a wafer in a single cmp module (U.S. Patent No. 7086936). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7086936

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