The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2006

Filed:

May. 21, 2003
Applicants:

Meng-chieh Liao, Hsinchu, TW;

Jiun-haw Lee, Taipei, TW;

Chi-chung Chen, Taipei, TW;

Inventors:

Meng-Chieh Liao, Hsinchu, TW;

Jiun-Haw Lee, Taipei, TW;

Chi-Chung Chen, Taipei, TW;

Assignee:

RiTdisplay Corporation, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 9/00 (2006.01); H01J 9/50 (2006.01); H01J 9/44 (2006.01); H01T 21/00 (2006.01); F23Q 23/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection and repair system includes an optical microscope, an image-retrieving device, an emission detector, a data controller, and a laser beam generator. When detecting the location of a defect, the system charges a detected region of an organic electroluminescent device with a negative bias or low forward bias before the device is lighted on. Then, the emission detector detects the locations of defects, which generate emission such as photons, thermal or IR emission, in an enlarged image. The laser beam generator generates a laser beam, which is used to isolate one of the defects. Furthermore, this invention also discloses a method for detecting and repairing an organic electroluminescent device.


Find Patent Forward Citations

Loading…