The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Jan. 28, 2004
Peter Heiligensetzer, Augsburg, DE;
Alwin Berninger, Aystetten, DE;
Norbert Settele, Petersdorf-Wilprechtszell, DE;
Peter Heiligensetzer, Augsburg, DE;
Alwin Berninger, Aystetten, DE;
Norbert Settele, Petersdorf-Wilprechtszell, DE;
KUKA Roboter GmbH, , DE;
Abstract
In order to improve the monitoring of a machine with movable parts, such as in particular an industrial robot, and for increasing safety, the invention provides a method for monitoring movable parts of a machine, such as an industrial robot, in which at least two different measured quantities are detected and at least one of these measured quantities is processed to a first measure result in such a way that it is comparable with another measured quantity or a second measure result obtained on the basis thereof, that the first measure result is compared with another measured quantity or a measure result obtained on the basis thereof and that a signal characterizing the comparison result is provided. The invention also provides a machine with movable parts, such as in particular an industrial robot, which is characterized by at least two measuring devices for detecting different measured quantities on movable parts of the machine, a processing unit for at least one measured quantity for the processing thereof into a first measure result comparable with another measured quantity or a second measure result obtained therefrom and a comparison unit for comparing the first measure result with at least one other measured quantity or a second measure result obtained on the basis thereof.