The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2006

Filed:

Apr. 29, 2004
Applicants:

Joseph Anthony Holung, Wake Forest, NC (US);

Noboru Kodama, Kanagawa-ken, JP;

Tin-lup Wong, Chapel Hill, NC (US);

Inventors:

Joseph Anthony Holung, Wake Forest, NC (US);

Noboru Kodama, Kanagawa-ken, JP;

Tin-Lup Wong, Chapel Hill, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Devices and their subassemblies typically undergo stresses during manufacturing and testing processes and during general use. To provide visual indication of stress or strain levels endured, a preferred embodiment includes frangible material deposited on particular isolated areas of devices and/or their subassemblies. The frangible material, when applied according to one methodical embodiment, provides visible indication of overstrain as cracks in the frangible material deposits, and of non overstrain when cracks are not visible.


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