The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2006

Filed:

Jan. 21, 2005
Applicants:

Edward H. Kilduff, New York, NY (US);

William Y. Kang, New York, NY (US);

Inventors:

Edward H. Kilduff, New York, NY (US);

William Y. Kang, New York, NY (US);

Assignee:

Dalla Piazza & Co., Schneisingen, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 19/00 (2006.01); A01B 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An adjustable measuring scoop including a movable partition that adjustably rotates on a rotating means such as an axle so as to result in a scoop size that can be selectively determined between a maximum and a minimum by ready manual manipulation of the scoop. The movable partition and rotating means are preferably configured so that the movable partition moves toward and away from the scoop's opening, permitting, e.g., a symmetric frontal contour that may be more effective in scooping from a container. Adjustment of the movable partition may also optionally be effected by means including a manual slide that has a linear and/or relatively short range of motion.


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