The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2006

Filed:

Oct. 25, 2001
Applicants:

Andrew Marshall, Dallas, TX (US);

C. Keith Burgess, Richardson, TX (US);

Charles D. Weinberger, McKinney, TX (US);

Madhu Sayala, Plano, TX (US);

Inventors:

Andrew Marshall, Dallas, TX (US);

C. Keith Burgess, Richardson, TX (US);

Charles D. Weinberger, McKinney, TX (US);

Madhu Sayala, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one aspect of the invention, a semiconductor die includes a plurality of resistive elements operable to receive a voltage differential between at least two of the resistive elements. The semiconductor die also includes a test circuit coupled to at least three tap points along the resistive elements. The test circuit is operable to measure a voltage at at least two of the tap points. A difference in the voltages between the at least two tap points is proportional to a resistance of the one or more resistive elements between the at least two tap points.


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