The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Jul. 23, 2002
Gareth J. Nicholls, Brokenhurst, GB;
Alexander H. Ainscow, Milton Keynes, GB;
Jon D. Garlett, Wappingers Falls, NY (US);
Bobak Modaress-razavi, Morrisville, NC (US);
Vernon R. Norman, Cary, NC (US);
Martin L. Schmatz, Rueschlikon, CH;
Gareth J. Nicholls, Brokenhurst, GB;
Alexander H. Ainscow, Milton Keynes, GB;
Jon D. Garlett, Wappingers Falls, NY (US);
Bobak Modaress-Razavi, Morrisville, NC (US);
Vernon R. Norman, Cary, NC (US);
Martin L. Schmatz, Rueschlikon, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, in an oversampling clock and data recovery system, for detecting that sampling is stuck taking place at a data edge, by detecting a data edge in an early or a late region relative to a good region and incrementing a stuck early or stuck late counter; and if one counter reaching a maximum, setting a condition indicating that sampling is stuck taking place at a data edge. If a data edge is detected in the good region, or in each of an early and a late region in a single data period, the stuck counters are reset to zero. The detection of which stuck counter has reached a maximum can cause the moving of a sampling clock forward or backward, ending when a data edge occurs in a good region, or in each of an early region and a late region in a single data period.