The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2006

Filed:

May. 21, 2002
Applicants:

Veton Z. Kepuska, Melbourne, FL (US);

Harinath K. Reddy, Norwood, MA (US);

Inventors:

Veton Z. Kepuska, Melbourne, FL (US);

Harinath K. Reddy, Norwood, MA (US);

Assignee:

Thinkengine Networks, Inc., Marlborough, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes (i) measuring first distances between (a) vectors belonging to a set of vectors that represent an utterance and (b) vectors belonging to a set of vectors that represent a template, the measuring being done in accordance with a first order of the utterance vectors a first order of the template vectors, and (ii) measuring second distances between (a) individual vectors belonging to the set of vectors that represent the utterance and (b) individual vectors belonging to the set of vectors that represent the template, the measuring being done in accordance with a second order of the utterance vectors and a second order of the template vectors, and (iii) in which the first template vector order and the second template vector order are different and/or the first utterance vector order and the second utterance vector order are different. In another aspect, a method includes measuring distances between vectors that represent an utterance and vectors that represent a template, generating information indicative of how well the vectors of the utterance match the vectors of the template, and making a matching decision based on the measured distances and on the generated information.


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