The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Apr. 18, 2000
Shizuo Sumida, Hiroshima-shi, Hiroshima 736-0085, JP;
Akio Nagamatsu, Kanagawa 248-0032, JP;
Shizuo Sumida, Hiroshima-shi, Hiroshima 736-0085, JP;
Akio Nagamatsu, Kanagawa 248-0032, JP;
Other;
Ono Sokki Co., Ltd., , JP;
Abstract
The present invention relates to a non-linear characteristic reproducing apparatus wherein a non-linear transformation processing is applied to a state quantity to be outputted. A non-linear behavior of products and parts is reproduced through modeling. [Solving means] there are provided a non-linear characteristic reproducing unit for receiving an estimated observation quantity at the subsequent sampling time of an input state quantity and determining a normalized estimated value in which an estimated value is normalized by an estimated observation quantity at the subsequent sampling time, and a state quantity transformation unit for transforming the input state quantity at the subsequent sampling time to the output state quantity at the subsequent sampling time in accordance with a non-linear operation based on the a normalized estimated value determined in the non-linear characteristic reproducing unit.