The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Oct. 01, 2003
Taketoshi Aratani, Atsugi, JP;
Tetsuya Mukunoki, Kawasaki, JP;
Kazuteru Hashizume, Yokohama, JP;
Takao Sugawara, Isehara, JP;
Kiyoharu Yagyu, Kowloon, HK;
Taketoshi Aratani, Atsugi, JP;
Tetsuya Mukunoki, Kawasaki, JP;
Kazuteru Hashizume, Yokohama, JP;
Takao Sugawara, Isehara, JP;
Kiyoharu Yagyu, Kowloon, HK;
Fujitsu Limited, Kawasaki, JP;
Abstract
A magnetic head testing apparatus includes reference information storing unit for holding a predetermined reference sampling period and a number of reference samplings, sampling unit for sampling reproduced data read a plurality of times from a magnetic medium in the reference sampling period, sampling number acquiring unit for acquiring a sampling number of measured data from a reproduced data base on a sampling result, sampling number ratio calculating unit for calculating a ratio of the sampling number of the measured data and the number of reference samplings, sampling data re-acquiring unit for changing the sampling period of the measured data depending on the calculated ratio and re-acquiring the sampling data and a measured data overlap-displaying unit for overlap-display of the sampling data re-acquired from the measured data a plurality of times.