The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Oct. 17, 2002
Toshiyuki Shinno, Otawara, JP;
Yuji Yanagida, Otawara, JP;
Shigeyuki Nakashima, Yaita, JP;
Yoshiaki Yaoi, Nasu-gun, JP;
Miwa Okumura, Kuroiso, JP;
Minoru Horinouchi, Otawara, JP;
Masahiko Yamazaki, Shioya-gun, JP;
Machiko Iso, Nasu-gun, JP;
Satoru Nakanishi, Utsunomiya, JP;
Toshiyuki Shinno, Otawara, JP;
Yuji Yanagida, Otawara, JP;
Shigeyuki Nakashima, Yaita, JP;
Yoshiaki Yaoi, Nasu-gun, JP;
Miwa Okumura, Kuroiso, JP;
Minoru Horinouchi, Otawara, JP;
Masahiko Yamazaki, Shioya-gun, JP;
Machiko Iso, Nasu-gun, JP;
Satoru Nakanishi, Utsunomiya, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An X-ray computed tomography apparatus of this invention includes a first data detecting system which includes a first X-ray tube and a first X-ray detector and a second data detecting system which includes a second X-ray tube and a second X-ray detector. A reconstructing unit reconstructs image data on the basis of the data detected by at least one of the first and second data detecting systems. A monitoring unit monitors the first data detecting system. In a period during which the first data detecting system is normal, data acquisition is performed by both the first and second data detecting systems. In a period during which the first data detecting system is faulty, data acquisition is performed by the second data detecting system alone.