The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Mar. 30, 2004
Applicants:
M. Turhan Taner, Houston, TX (US);
Evgeny Landa, Pau, FR;
Inventors:
M. Turhan Taner, Houston, TX (US);
Evgeny Landa, Pau, FR;
Assignee:
RDSP I, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is disclosed for seismic imaging of subsurface diffractors. The method includes performing migration velocity analysis on a seismic time record section and depth migrating the time section for offsets exceeding one-half a distance between a seismic energy source and a seismic receiver most distant from the source during acquisition of seismic data used to generate the time record section.