The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2006
Filed:
Feb. 12, 2004
Gregory J. Fredeman, Staatsburg, NY (US);
Mark D. Jacunski, Colchester, VT (US);
Toshiaki Kirihata, Poughkeepsie, NY (US);
Matthew R. Wordeman, Kula, HI (US);
Gregory J. Fredeman, Staatsburg, NY (US);
Mark D. Jacunski, Colchester, VT (US);
Toshiaki Kirihata, Poughkeepsie, NY (US);
Matthew R. Wordeman, Kula, HI (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for allocating redundancies during a multi-bank operation in a memory device which includes two or more redundancy domains is described. The method includes steps of enabling a pass/fail bit detection to activate a given bank. The pass/fail bit detection is prompted only for a selected domain and is disabled when it addresses other domains. By altering the domain selection, it is possible to enable a redundancy allocation for any domain regardless of the multi-bank operation. The method may preferably be realized by using a dynamic exclusive-OR logic with true and complement expected data pairs. When combined with simple pointer logic, the selection of domains may be generated internally, simplifying the built in self-test and other test control protocols, while at the same time tracking those that fail.